Equipment
JEOL-100CXII Transmission Electron Microscope
General:
The JEOL-100CXII is a conventional TEM, optimized for diffraction contrast imaging and electron diffraction studies. It operates at energy up to 100kV. A double tilt holder is available with +/-60 degrees of X tilt and +/-36 degrees of Y tilt. The TEM is used for microstructural and crystallographic studies of a wide variety of materials including metal alloys, polymers, nanostructured materials, and biomaterials.
Specifications
Location: WB248
Materials Characterization
Laboratory
Transmission Electron Microscope
Last modified: Apr 30, 2008, 19:30 EDT